2026-09-11+00:00 09:43:37+00:00 177100 RES-0001 selec-w TEN-0001 t-oth-eea 1 CON-0001 LOT-0000 TEN-0001 177100 no TPA-0001 LOT-0000 tenderReference-4788164-949073 CON-0001 2026-09-10Z ORG-0002 EQUIPMENT PURCHASE AGREEMENT - Kelvin Probe Force Microscopy TEN-0001 TPA-0001 ORG-0003 29 http://www.oikeus.fi/markkinaoikeus ORG-0001 Markkinaoikeus Radanrakentajantie 5 Helsinki 00520 FI1B1 FIN 3006157-6 +358 295643300 markkinaoikeus@oikeus.fi false false https://www.vttresearch.com/fi ORG-0002 VTT Technical Research Centre of Finland Ltd P.O. Box 1000, VTT Espoo 02044 FI1B1 FIN 2647375-4 VTT Technical Research Centre of Finland Ltd +358 20722111 kilpailutus@vtt.fi sme ORG-0003 Concept Scientific Instruments 2, rue de la Terre de Feu LES ULIS 91940 FR101 FRA 00489 629 030. http://hankintailmoitukset.fi ORG-0004 Hansel Oy (Hilma) Mannerheiminaukio 1a Helsinki 00100 FI1B1 FIN FI09880841 eSender 029 55 636 30 tekninen@hankintailmoitukset.fi 00630159-2026177/20262026-09-14+02:00 2.3 eforms-sdk-1.13 d4ccdef6-c4d3-4667-a3b0-d38de4639c97 9254dad3-1129-469d-83fc-aab1c11fe69e 2026-09-11+00:00 09:43:36+00:00 01 32014L0024 can-standard ENG pub-undert econ-aff ORG-0002 ted-esen ORG-0004 The tender process was based on the open procedure applicable to contracts that exceed the EU procurement threshold. open f17d3fdc-408c-42ab-b7e9-8a785b64551f-01 false Reg.no. 59/206/2025 Kelvin probe force microscopy (KPFM) The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents. supplies The objective was to find one professional supplier that could supply high-quality equipment, equipment installation, and user training. VTT Technical Research Centre of Finland Ltd chose one supplier from among the tenderers. 38300000 Please see invitation to tender. FI1B1 FIN LOT-0000 false no-eu-funds per-exa 50 price The evaluation of the tenders is described in section 'Grounds for decision' in the invitation to tender. per-exa 50 quality The evaluation of the tenders is described in section 'Grounds for decision' in the invitation to tender. ORG-0002 The appeal period is determined in accordance with the Act on Public Procurement and Concession Contracts (1397/2016). ORG-0001 true false none none Reg.no. 59/206/2025 Kelvin probe force microscopy (KPFM) The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and liquid environments was required to enable in-situ studies under variable atmospheric conditions. The system provides stable scanning, possibly flexible imaging modes of tapping and/or non-contacting, and compatibility with applications across metals and energy materials. Because of this, the system allows large samples with complex topography. The technical specification of the equipment and the tender process to be supplied was discussed in more detail in the invitation to tender documents. The object of the tender process was described in more detail in the invitation to tender documents. supplies The objective was to find one professional supplier that could supply high-quality equipment, equipment installation, and user training. VTT Technical Research Centre of Finland Ltd chose one supplier from among the tenderers. hum-right 38300000 Please see invitation to tender. FI1B1 FIN 6 2000-01-01Z