Kort beskrivning
Karlstad University will acquire a multi-purpose X-ray diffraction system including hardware and software.
It should be suitable for phase and structural analysis, residual stress measurements, texture measurements, thin film applications and optional measurements. It should be suited for smaller laboratory specimens, solids and powders, as well as for larger specimens in application oriented measurements e.g. as with residual stress measurements. Thin film phase analysis studies of growth of nano-sized oxide particles are of interest and hence an interest in small angle measurements.