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Netherlands-Petten: NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
Notice for changes or additional information
(Supplement to the Official Journal of the European Union, 2019/S 105-254383)
Section I: Contracting authority/entity
Section II: Object
NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging.The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micromachining of micromechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.
Section VI: Complementary information
Section VII: Changes